interferometric Testing and Description of Polarization Ray Tracing in Multi-layer Thin Films

The production of thin films and their use in different industries necessitates the determination of their optical properties. This paper proposes an extended mathematical model of the output fringe field interference pattern. A general interference formula based on variable-incidence-angle polarizing interference microscopy has been derived for measurement of the optical properties of multi-layer thin film.

In comparison with other well-known interferometric methods, the measurement accuracy of this new method is discussed.

An example of applications to polypropylene sulfide (treated; coated on both sides with PVDC co-polymer) thin film is given.