الخبرات
- Ellipsometery
Machine Shop equipment operation
Data Acquisition system - LabView ™ programming
Thin films techniques (wet – PVD – CVD)i
Surface Area analyzer (BET)i
Optical profiler - Stylus profiler
Atomic force microscopy (AFM)i
X-ray diffractometer (XRD)i
X-ray photoelectron microscopy (XPS)i
Magnetic measurements (VSM – SQUID-AC susceptibility)i
Low noise signal measurements
Cryogenic / Ultra High Vacuum
Electron microscopy (SEM - TEM) operation and maintenance